IMIX, the Integrated Microanalyzer for Images and X rays, which links an X-ray detector in an EM with a SUN Workstation multi-tasking environment, is a premier system for Energy Dispersive Spectroscopy. EDS is a standard technique for qualitative and quantitative analysis of solid samples as small as 1 cubic micrometer. This is combined with the extensive image processing and analysis programs of ImageCraft to give the analyst the tools needed for complete evaluation of small areas of a specimen.
X-ray Data Acquisition and
AnalysisDigital signal processing provides extraordinary enhancement of X-ray spectra to give clean, well-resolved peaks with improved precision and optimum light element sensitivity. The analyst has complete control over the spectrum display, including multiple spectra displayed separately or together for comparison, and split screen display for highlighting detail. Each display window has its own menu of features:
With PGT's Spotlight Analysis program, regions for X-ray analysis are selected directly from a digital micrograph. Automated data collection, using spot mode or variable size raster, is done at specific points, along a specified line, or as a series of random points. SEM control and optional stage automation provide completely unattended data acquisition for multiple areas of interest and even for multiple samples.
AutoID automatic element identification is a sophisticated rules-based spectrum analysis algorithm which emulates the identification strategy used by experienced analysts. This program automatically strips overlapped peaks, evaluates relative intensities, and searches for additional lines to confirm the final element identification. The element list is saved, along with the operating parameters, as part of the spectrum documentation.
The PGT Quantitative Analysis program can be conveniently run through the X-ray display or as a free-standing program. It has been completely revised to handle light elements. The analysis can be done with all standards collected by the analyst or with no standards at all. In addition, a unique hybrid approach can be used in which theoretical system-generated standards are used only for elements for which no user-supplied standards are given. Even M line standards can be generated to take advantage of these high intensity peaks for maximum precision.
Several special analyses are also available:
Collecting line profiles and digital element maps has never been easier than with IMIX-PTS! Whether you observe the maps as they are collected, or generate them later, you can easily see relationships using SpectrumScan phase mapping, ImageMath, or the True Color Transform program.
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